Automated feature localization for hardware designs using coverage metrics
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Art |
Autor/en | J. Malburg, A. Finder, and G. Fey | Jahr | 2012 | In | Design Automation Conference (DAC) | Seiten | 941–946 | Doi | http://dx.doi.org/10.1145/2228360.2228529 |
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Konferenzbeitrag |
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Effective robustness analysis using bounded model checking techniques
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Art |
Autor/en | G. Fey, A. Sülflow, S. Frehse, and R. Drechsler | Jahr | 2011 | In | IEEE Transactions on Computer Aided Design of Circuits and Systems (TCAD) | Jahrgang | 30 | Heft | 8 | Seiten | 1239–1252 | Link zu Volltext | http://dx.doi.org/10.1109/TCAD.2011.2120950 |
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Zeitschriftenaufsatz |
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Automatic fault localization for property checking
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Art |
Autor/en | G. Fey, S. Staber, R. Bloem, and R. Drechsler | Jahr | 2008 | In | IEEE Transactions on Computer Aided Design of Circuits and Systems (TCAD) | Jahrgang | 27 | Heft | 6 | Seiten | 1138–1149 | Doi | http://dx.doi.org/10.1109/TCAD.2008.923234 |
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Zeitschriftenaufsatz |
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Robustness and Usability in Modern Design Flows
(Herausgeber)
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Art |
Autor/en | G. Fey and R. Drechsler | Jahr | 2008 | In | Springer Verlag |
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Monographie |
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Minimizing the number of paths in BDDs - theory and algorithm
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Art |
Autor/en | G. Fey und R. Drechsler | Jahr | 2006 | In | IEEE Transactions on Computer Aided Design of Circuits and Systems (TCAD) | Jahrgang | 25 | Heft | 1 | Seiten | 4-11 | Doi | http://dx.doi.org/10.1109/TCAD.2005.852662 |
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Zeitschriftenaufsatz |
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