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High-Profile Areas |
» Materials Science and Production Engineering
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Affiliation to an institute |
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Affialation to a work group |
Code |
Indication  |
Indication  |
Faculty |
Keywords  |
Keywords  |
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F01 |
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Natural sciences
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» Condensed Matter Physics
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Researchers with cooperation |
Institution |
City |
Category |
Country of origin |
OSRAM Optosemiconductors |
Regensburg |
Company |
Germany |
MPI für Eisenforschung GmbH (Prof. Dierk Raabe) |
Düsseldorf |
Max Planck Society |
Germany |
Prof. D. Gerthsen, Karlsruhe Institute of Technology |
Karlsruhe |
University Germany |
Germany |
Prof. K. Volz, Struktur- & Technologieforschungslabor |
Marburg |
University Germany |
Germany |
Prof. A. Hangleiter, Institut für Angewandte Physik, TU Braunschweig |
Braunschweig |
University Germany |
Germany |
Prof. D. Lamoen und Dr. J. Titantah, Universität Antwerpen |
Antwerpen |
University abroad |
Belgium |
Prof. P.V. Satyam, Institute of Physics |
Bubaneshwar |
Research Center abroad |
India |
Prof. Kenji Tsuda, Tohoku University |
Tohoku |
University abroad |
Japan |
Prof. Bäumer FB 02: Biologie/Chemie |
Bremen |
University Germany |
Germany |
Prof. Lutz Mädler FB 04: Produktionstechnik, Maschinenbau & Verfahrenstechnik |
Bremen |
University Germany |
Germany |
Prof. X. Fischer FB 05: Geowissenschaften |
Bremen |
University Germany |
Germany |
Prof. Zoch FB 04, Institut für Werkstofftechnik |
Bremen |
University Germany |
Germany |
Prof. Frauenheim FB 01: BCCMS |
Bremen |
University Germany |
Germany |
Prof. D. Hommel, FB01, IFP, Epitaxie |
Bremen |
University Germany |
Germany |
Prof. J. Falta, FB01, IFP, Oberflächenphysik |
Bremen |
University Germany |
Germany |
Prof. F. Jahnke, FB01, ITP (Theoretische Physik) |
Bremen |
University Germany |
Germany |
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Most significant projects |
Code |
Indication  |
Indication  |
Cooperation partners |
Funding sources/agencies |
Term |
Elektronenstreudaten |
Bestimmung von Elektronenstreudaten zur Zusammensetzungsanalyse von Halbleiternanostrukturen mittels hochauflösender Elektronenmikroskopie |
Measurement of electron scattering data for composition analysis of semiconductor nanostructures by high resolution transmission electron microscopy |
Prof. Dr. Dirk Lamoen, TSM-group, Departement Fysica, Universiteit Antwerpen, Groenenborgerlaan 171, B-2020 Antwerpen Dr. John Tatini Titantah, TSM-group, Departement Fysica, Universiteit Antwerpen, Groenenborgerlaan 171, B-2020 Antwerpen |
Deutsche Forschungsgemeinschaft (DFG) |
2013 - 2017 |
Z-Kontraste |
Messung der Zusammensetzung von Nanostrukturen durch Quantifizierung von Z-Kontrast in der Rastertransmissionselektronenmikroskopie |
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Deutsche Forschungsgemeinschaft (DFG) |
2009 - 2015 |
Elektronenstreudaten |
Bestimmung von Elektronenstreudaten zur Zusammensetzungsanalyse von Halbleiternanostrukturen mittels hochauflösender Elektronenmikroskopie |
Measurement of electron scattering data for composition analysis of semiconductor nanostructures by high resolution transmission electron microscopy |
Prof. Dr. Dirk Lamoen, TSM-group, Departement Fysica, Universiteit Antwerpen, Groenenborgerlaan 171, B-2020 Antwerpen Dr. John Tatini Titantah, TSM-group, Departement Fysica, Universiteit Antwerpen, Groenenborgerlaan 171, B-2020 Antwerpen |
Drittmittel: Deutsche Forschungsgemeinschaft |
2006 - 2013 |
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Agencies that have funded your research during the past five years (public institutions and foundations) |
» DFG
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Funding sources during the past five years (enterprises) |
Company name |
Country of origin |
Term |
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Publications (Hyperlink) |
http://server.ifp.uni-bremen.de/uploads/images/Electron/publications_page/wbs_pub/index.html
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Most significant Publications |
Quantification of segregation and mass transport in InxGa1-xAS/GaAs Stranski-Krastanow layer
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Type |
Author(s) | Rosenauer, A.,; Gerthsen, D.; Van Dyck, D.; et al. | Year | 2001 | In | Physical Review B | Year | 64 | Issue | 24 | Pages | 245334 | Doi | 10.1103/=hysRevB.64.245334 |
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Article |
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Structural and chemical analysis of CdSe//nSe nanostructures by transmission electron microscopy
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Type |
Author(s) | Peranio, N.; Rosenauer, A.; Gerthsen, D.; et al. | Year | 2000 | In | Physical Review B | Year | 61 | Issue | 23 | Pages | 16015-16024 | Doi | 10.1103/PhysRevB.61.16015 |
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Article |
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Investigation on the Stranski-Krastanow growth of CdSe quantum dots
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Type |
Author(s) | Schikora, D.; Schwedhelm, S.; As, D.; et al. | Year | 2000 | In | Applied Physics Letters | Year | 76 | Issue | 4 | Pages | 418-420 | Doi | 10.1063/1.125773 |
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Article |
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Composition fluctuations in InGaN analyzed by transmission electron microscopy
(Publisher)
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Type |
Author(s) | Gerthsen, D.; Hahn, E.; Neubauer, B.; et al. | Year | 2000 | In | Physica Status Solidi A-Applications and Materials Science | Year | 177 | Issue | 1 | Pages | 145-155 | Doi | 10.1002/(SICI)1521-396X(2200001)177:13.0CO;2-0 |
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Conference Paper |
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Composition evaluation by lattice fringe analysis
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Type |
Author(s) | Rosenauer, A.; Fischer, U.; Gerthsen, D.; et al. | Year | 1998 | In | Ultramicroscopy | Year | 72 | Issue | 3-4 | Pages | 121-133 | Doi | 10.1016/S0304-3991(98)00002-3 |
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Article |
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Digital analysis of high resolution transmission electron microscopy lattice images
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Type |
Author(s) | Rosenauer, A. ; Kaiser, S.; Reisinger, T.; et al. | Year | 1996 | In | OPTIK | Year | 102 | Issue | 2 | Pages | 63-69 |
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Article |
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First Ph.D. supervisor |
Title of the dissertation |
First name Last name |
Sex |
Year |
Chemische Analyse von GaNAs und InGaNAs-Schichtstrukturen mittels HAADF-STEM 2013 |
Tim Jasper Grieb |
männlich |
2013 |
Quantitative STEM an indiumhaltigen Gruppe III-V Halbleiternanostrukturen |
Thorsten Mehrtens |
männlich |
2013 |
Transmission electron microscopy of InGaNAs nanostructures using ab-initio structure factors for strain-relaxed supercells. |
Knut Müller |
männlich |
2011 |
Titel folgt |
Katharina Gries |
weiblich |
2011 |
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Visiting Scientists |
Name |
Term |
Institution of origin |
Country of origin |
Ashutosh Rath |
27.11-21.12. 2010 |
Institute of Physics, Bhubaneswar |
India |
Gerardo Martinez |
21.02.-25.02.2011 |
Universität Antwerpen |
Belgium |
Prof. P.V. Satyam |
15.06.2010 -14.06.2011 |
Institute of Physics, Bhubaneswar |
India |
Prof. P.V. Satyam |
13.04.-28.04.2013 |
Institute of Physics, Bhubaneswar |
India |
Prof. Verbeeck |
06.04.-04.05.2008 |
Universität Antwerpen |
Belgium |
R. R. Juluri |
13.04.-26.04.2013 |
Institute of Physics, Bhubaneswar |
India |
Sandra van Aert |
21.02.-25.02.2011 |
Universität Antwerpen |
Belgium |
Van den Broek, Wouter |
01.02.-30.04. 2011 |
Universität Antwerpen |
Belgium |
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Resources |
Transmission electron microscop (TEM)
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